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Role of point defects in the transient diffusion and clustering of implanted boron in silicon

โœ Scribed by N.E.B. Cowern; H.F.F. Jos; K.T.F. Janssen


Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
417 KB
Volume
4
Category
Article
ISSN
0921-5107

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