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Grazing incidence diffuse x-ray scattering investigation of the properties of irradiation-induced point defects in silicon

✍ Scribed by Partyka, P.; Zhong, Y.; Nordlund, K.; Averback, R. S.; Robinson, I. M.; Ehrhart, P.

Book ID: 121329152
Publisher: The American Physical Society
Year: 2001
Tongue: English
Weight: 119 KB
Volume: 64
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.64.235207

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