✦ LIBER ✦
Study of point defect clusters in high purity single crystals of silicon grown by Czochralski and float-zone methods by diffuse X-ray scattering technique
✍ Scribed by R.R Ramanan; G Bhagavannarayana; Krishan Lal
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 436 KB
- Volume
- 156
- Category
- Article
- ISSN
- 0022-0248
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