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Secure Scan: A Design-for-Test Architecture for Crypto Chips

✍ Scribed by Bo Yang; Kaijie Wu; Karri, R.

Book ID: 117907617
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 206 KB
Volume: 25
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.862745

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