โ Scribed by Hyoung B. Min; William A. Rogers
No coin nor oath required. For personal study only.
This paper presents an efficient automatic test pattern generation technique for loop-free circuits. A partial scan technique is used to convert a sequential circuit (finite state machine) with arbitrary feedback paths into a pipelined circuit for testing. Test generation for these modified circuits can be performed with a modified combinational automatic test pattern generator (ATPG), which is much faster than a sequential ATPG. A combinational model is obtained by replacing all flipflops by buffers. It is shown that a test vector for a fault in this model obtained by a combinational test generator can be expanded into a sequence of identical vectors to detect the same fault in the original sequential circuit. This technique may abort a few faults which can then be resolved with a sequential ATPG. Experiments on the ISCAS89 circuits show that only 30 % to 70 % of flipfops require scanning in larger circuits and 96 % to 100 % fault coverage for almost all the circuits without resorting to a sequential ATPG.
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