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Secondary Structure of α-Synuclein Oligomers: Characterization by Raman and Atomic Force Microscopy

✍ Scribed by Mihaela M. Apetri; Nakul C. Maiti; Michael G. Zagorski; Paul R. Carey; Vernon E. Anderson


Book ID
116662606
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
379 KB
Volume
355
Category
Article
ISSN
0022-2836

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The surface structure of SnSe was studied by atomic force microscopy (AFM). The measured periodicities in the ( 100) and ( 101) planes as obtained from AFM images are consistent with those derived from the theoretical SnSe crystalline cell. The slight di4erences observed are the likely result of sur