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Secondary ion mass spectrometry depth profiling of 59Co implanted into nickel

✍ Scribed by L. Vincent; T. Sauvage; S. Houdayer; C. Tessier; S. Gautrot; O. Kaı&#x0308;tasov; J. Chaumont; M. Vayer

Book ID: 114167168
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 161 KB
Volume: 207
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(03)00837-1

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