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Secondary defect formation in self-ion irradiated silicon

✍ Scribed by R.D. Goldberg; T.W. Simpson; I.V. Mitchell; P.J. Simpson; M. Prikryl; G.C. Weatherly

Book ID: 113286819
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 551 KB
Volume: 106
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(95)00706-7

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