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Scanning tunneling microscopy investigation of the microtopography of SiO2and Si surfaces at the Si/SiO2interface in SIMOX structures

✍ Scribed by D. V. Vyalykh; S. I. Fedoseenko

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Evolution of step-terrace structure at S

✍ T. Ishiyama; M. Nagase; Y. Omura 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 129 KB

Calculation of Surface Charge Noise at t

✍ Ghibaudo, G. 📂 Article 📅 1987 🏛 John Wiley and Sons 🌐 English ⚖ 746 KB

Iron accumulation at the Si-SiO2 interfa

✍ Y. Kamiura; F. Hashimoto; M. Iwami 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 338 KB

Structural fluctuation of SiO2 network a

✍ Y. Sugita; S. Watanabe; N. Awaji; S. Komiya 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 352 KB

Investigation of the SiSiO2 interface b

✍ J. Kassabov; D. Dimitrov 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 453 KB

Ellipsometric study of Si surface roughn

✍ A Aizenberg; AV Andrianov; SV Nosenko; VI Pshenicin; IA Hromcovski 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 125 KB