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Scaling and strain dependence of nanoscale strained-Si p-MOSFET performance

✍ Scribed by Bufler, F.M.; Fichtner, W.

Book ID: 114617266
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 318 KB
Volume: 50
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2003.819655

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