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Scalable model for predicting the effect of negative bias temperature instability for reliable design

✍ Scribed by Bhardwaj, S.; Wang, W.; Vattikonda, R.; Cao, Y.; Vrudhula, S.

Book ID: 114442500
Publisher: The Institution of Engineering and Technology
Year: 2008
Tongue: English
Weight: 551 KB
Volume: 2
Category: Article
ISSN: 1751-858X
DOI: 10.1049/iet-cds:20070225

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