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Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits

✍ Scribed by Paul, B.C.; Kunhyuk Kang; Kufluoglu, H.; Alam, M.A.; Roy, K.


Book ID
117907804
Publisher
IEEE
Year
2007
Tongue
English
Weight
706 KB
Volume
26
Category
Article
ISSN
0278-0070

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