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Impact of negative bias temperature instability on digital circuit reliability

✍ Scribed by Vijay Reddy; Anand T. Krishnan; Andrew Marshall; John Rodriguez; Sreedhar Natarajan; Tim Rost; Srikanth Krishnan

Book ID: 104057778
Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 356 KB
Volume: 45
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2004.05.023

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