✦ LIBER ✦

Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics

✍ Scribed by H.W. Chen; C.H. Liu

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Impact of negative bias temperature inst

✍ Vijay Reddy; Anand T. Krishnan; Andrew Marshall; John Rodriguez; Sreedhar Natara 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 356 KB

Observations in trapping characteristics

✍ J.C. Liao; Y.K. Fang; Y.T. Hou; W.H. Wu; C.L. Hung; P.F. Hsu; K.C. Lin; K.T. Hua 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 493 KB