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Modeling to predict the time evolution of negative bias temperature instability (NBTI) induced single event transient pulse broadening

✍ Scribed by ShuMing Chen; JianJun Chen; YaQing Chi; FanYu Liu; YiBai He


Book ID
118814296
Publisher
SP Science China Press
Year
2012
Tongue
English
Weight
661 KB
Volume
55
Category
Article
ISSN
1006-9321

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