𝔖 Bobbio Scriptorium

✦ LIBER ✦

SAT-based generation of compressed skewed-load tests for transition delay faults

✍ Scribed by Dobai, Roland; Balaz, Marcel

Book ID: 120622092
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 569 KB
Volume: 37
Category: Article
ISSN: 0141-9331
DOI: 10.1016/j.micpro.2012.09.002

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A SAT Based Test Generation Method for D

A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits

✍ Mele, S.; Favalli, M. 📂 Article 📅 2011 🏛 IEEE 🌐 English ⚖ 324 KB

Built-in test sequence generation for sy

Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of input sequences using single and multiple fault detection times

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2002 🏛 IEEE 🌐 English ⚖ 372 KB

[IEEE 2006 21st IEEE International Sympo

[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Scan-Based Delay Fault Tests for Diagnosis of Transition Faults

✍ Pomeranz, Irith; Reddy, Sudhakar 📂 Article 📅 2006 🏛 IEEE ⚖ 131 KB

[IEEE 2014 International Symposium on Ne

[IEEE 2014 International Symposium on Next-Generation Electronics (ISNE) - Kwei-Shan Tao-Yuan, Taiwan (2014.5.7-2014.5.10)] 2014 International Symposium on Next-Generation Electronics (ISNE) - Multi-function controller for low-power multiple scan test of transition delay faults

✍ Liang, Hsing-Chung; Ho, Chang-Jung 📂 Article 📅 2014 🏛 IEEE ⚖ 532 KB