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[IEEE 2014 International Symposium on Next-Generation Electronics (ISNE) - Kwei-Shan Tao-Yuan, Taiwan (2014.5.7-2014.5.10)] 2014 International Symposium on Next-Generation Electronics (ISNE) - Multi-function controller for low-power multiple scan test of transition delay faults

✍ Scribed by Liang, Hsing-Chung; Ho, Chang-Jung

Book ID: 125539677
Publisher: IEEE
Year: 2014
Weight: 532 KB
Category: Article
ISBN: 1479947806
DOI: 10.1109/ISNE.2014.6839366

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