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Rutile-type TiO2 thin film for high-k gate insulator

โœ Scribed by Masaru Kadoshima; Masahiko Hiratani; Yasuhiro Shimamoto; Kazuyoshi Torii; Hiroshi Miki; Shinichiro Kimura; Toshihide Nabatame


Book ID
108388536
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
402 KB
Volume
424
Category
Article
ISSN
0040-6090

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Strontium tantalate (STO) films were grown by liquid-delivery (LD) metalorganic chemical vapor deposition (MOCVD) using Sr[Ta(OEt) 5 (OC 2 H 4 OMe)] 2 as precursor. The deposition of the films was investigated in dependence on process conditions, such as substrate temperature, pressure, and concentr