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Rutherford backscattering studies of solid phase recrystallization and incorporation in erbium-implanted silicon

✍ Scribed by Dai-qing Li; Ting-qi Ren; Bao-an Gong; Bei Zhang; Kong-jun Chen; Pei-ran Zhu; Tian-bing Xu

No coin nor oath required. For personal study only.

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