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RTL DFT Techniques to Enhance Defect Coverage for Functional Test Sequences

✍ Scribed by Hongxia Fang; Krishnendu Chakrabarty; Hideo Fujiwara


Book ID
106384460
Publisher
Springer US
Year
2010
Tongue
English
Weight
396 KB
Volume
26
Category
Article
ISSN
0923-8174

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