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Routine mass-thickness and nonuniformity determinations of thin films

✍ Scribed by K.F. Wylie; G.R. Hagee

Publisher: Elsevier Science
Year: 1965
Weight: 459 KB
Volume: 32
Category: Article
ISSN: 0029-554X
DOI: 10.1016/0029-554x(65)90511-2

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