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Comparison between newly developed and classical determinations of index and thickness of thin films on substrates by ellipsometry

✍ Scribed by T. Easwarakhanthan; M. Remy

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ H. Arwin; D.E. Aspnes 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 861 KB

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✍ R.M.A. Azzam; A.-R.M. Zaghloul 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 265 KB