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Round robin study of impurity analysis in gallium arsenide using secondary ion mass spectrometry

โœ Scribed by Homma, Yoshikazu.; Kurosawa, Satoru.; Yoshioka, Yoshiaki.; Shibata, Masahiro.; Nomura, Koichi.; Nakamura, Yasushi.


Book ID
126875974
Publisher
American Chemical Society
Year
1985
Tongue
English
Weight
740 KB
Volume
57
Category
Article
ISSN
0003-2700

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Secondary ion mass spectrometry round-ro
โœ Homma, Y.; Tohjou, F.; Masamoto, A.; Shibata, M.; Shichi, H.; Yoshioka, Y.; Adac ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 330 KB ๐Ÿ‘ 2 views

Round-robin studies on relative sensitivity factors (RSFs) in secondary ion mass spectrometry (SIMS) were conducted using bulk GaAs samples uniformly doped with various impurity elements. A total of 31 laboratories participated in two round-robins. More than 30 sets of relative ion intensities were