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Ion yields of impurities in gallium arsenide for secondary ion mass spectrometry

✍ Scribed by Homma, Yoshikazu.; Tanaka, Tohru.

Book ID: 127394320
Publisher: American Chemical Society
Year: 1986
Tongue: English
Weight: 664 KB
Volume: 58
Category: Article
ISSN: 0003-2700
DOI: 10.1021/ac00297a028

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