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Rheed and x-ray characterization of InGaAs/GaAs grown by MBE

✍ Scribed by Shizuo Fujita; Yasushi Nakaoka; Tetsuya Uemura; Masao Tabuchi; Susumu Noda; Yoshikazu Takeda; Akio Sasaki

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 339 KB
Volume: 95
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(89)90388-6

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