A statistical description of the global performance of on-chip spiral inductors, based on extensive measurement is presented. These inductors were fabricated with different turn numbers or track lengths/track widths, but with the same spacing. From the S parameters measured using a de-embedding tech
RF parameter extraction of MMIC nichrome resistors
β Scribed by Renu Sharma; Seema Vinayak; D. S. Rawal; Ashok Kumar; U. C. Ray
- Book ID
- 102515667
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 343 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0895-2477
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β¦ Synopsis
Abstract
The lumpedβelement electrical equivalent circuit of nichrome (NiCr) resistors is important for monolithic microwave integrated circuit (MMIC) design. This paper presents a methodology for the RF parameter extraction of thinβfilm NiCr resistors fabricated on GaAs substrate. An algorithm based on DUT S parameters has been developed to extract the electrical parameters of the equivalent circuit up to 18 GHz for a large number of resistors of varying geometries and geometryβscaleable curveβfitted equations for the model parameters have been obtained. The computed S parameters, based on the extracted model parameters, agree reasonably well with the measured S parameters. Β© 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 409β412, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11233
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