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Reverse Current Characteristics of Hydrogenated Amorphous Silicon-Crystalline Silicon Heterojunctions

✍ Scribed by Mimura, Hidenori; Hatanaka, Yoshinori


Book ID
125968688
Publisher
Institute of Pure and Applied Physics
Year
1987
Tongue
English
Weight
1004 KB
Volume
26
Category
Article
ISSN
0021-4922

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## Abstract To study recombination at the amorphous/crystalline Si (a‐Si:H/c‐Si) heterointerface, the amphoteric nature of silicon (Si) dangling bonds is taken into account. Modeling interface recombination measured on various test structures provides insight into the microscopic passivation mechan