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Resistive Switching Characteristics and Failure Analysis of TiO[sub 2] Thin Film Deposited by RF Magnetron Sputtering System

✍ Scribed by Jung, Ho Yong; Oh, Sang Chul; Lee, Heon

Book ID: 119949085
Publisher: The Electrochemical Society
Year: 2011
Tongue: English
Weight: 841 KB
Volume: 158
Category: Article
ISSN: 0013-4651
DOI: 10.1149/1.3526316

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