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Residuals and Their Analyses for Accelerated Life Tests With Step and Varying Stress

✍ Scribed by Nelson, W.B.

Book ID: 114668673
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 269 KB
Volume: 57
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.2008.920789

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