A model for step-stress accelerated life testing
β Scribed by A.D. Dharmadhikari; Md. Monsur Rahman
- Publisher
- John Wiley and Sons
- Year
- 2003
- Tongue
- English
- Weight
- 216 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0894-069X
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π SIMILAR VOLUMES
This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo
This paper introduces a general or "distribution-free" model to analyze the lifetime of components under accelerated life testing. Unlike the accelerated failure time (AFT) models, the proposed model shares the advantage of being "distribution-free" with the proportional hazard (PH) model and overco
Accelerated life testing (ALT) is concerned with subjecting items to a series of stresses at several levels higher than those experienced under normal conditions so as to obtain the lifetime distribution of items under normal levels. A parametric approach to this problem requires two assumptions. Fi