Optimum step-stress accelerated life test plans for log-location-scale distributions

Optimum simple step-stress accelerated l

Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring

✍ Do Sun Bai; Myung Soo Kim 📂 Article 📅 1993 🏛 John Wiley and Sons 🌐 English ⚖ 753 KB

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo