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Comparison Analysis of Efficiency for Step-Down and Step-Up Stress Accelerated Life Testing

โœ Scribed by Ronghua Wang; Naijun Sha; Beiqing Gu; Xiaoling Xu


Book ID
117935472
Publisher
IEEE
Year
2012
Tongue
English
Weight
339 KB
Volume
61
Category
Article
ISSN
0018-9529

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โœ Do Sun Bai; Myung Soo Kim ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 753 KB

This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo