Optimum step-stress partially accelerated life tests for the truncated logistic distribution with censoring
โ Scribed by Preeti Wanti Srivastava; Neha Mittal
- Book ID
- 108057085
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 297 KB
- Volume
- 34
- Category
- Article
- ISSN
- 0307-904X
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
This article presents an optimum simple step-stress accelerated life test for the Weibull distribution under Type I censoring. It is assumed that a log-linear relationship exists between the Weibull scale parameter and the (possibly transformed) stress and that a certain cumulative exposure model fo
This paper considers optimal designs of partially accelerated life tests in which test items are first run simultaneously at use condition for a specified time, and the surviving items are then run at accelerated condition until a predetermined censoring time. For items having lognormally distribute