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Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

✍ Scribed by Bai, D.S.; Chung, S.W.

Book ID
114555032
Publisher
IEEE
Year
1992
Tongue
English
Weight
602 KB
Volume
41
Category
Article
ISSN
0018-9529

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Optimal design of partially accelerated
Optimal design of partially accelerated life tests for the lognormal distribution under type I censoring
✍ D.S. Bai; S.W. Chung; Y.R. Chun πŸ“‚ Article πŸ“… 1993 πŸ› Elsevier Science 🌐 English βš– 661 KB

This paper considers optimal designs of partially accelerated life tests in which test items are first run simultaneously at use condition for a specified time, and the surviving items are then run at accelerated condition until a predetermined censoring time. For items having lognormally distribute