Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring : D. S. Bai and S. W. Chung. IEEE Transactions on Reliability, 41(3), 400 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 101 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90418-x