Optimum simple ramp-tests for the Weibull distribution and type I censoring : D. S. Bai, M. S. Cha and S. W. Chung. IEEE Transactions on Reliability, 41(3), 407 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 224 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90403-l