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Residual stress effect on hardness and yield strength of Ni thin film

✍ Scribed by Z.S. Ma; Y.C. Zhou; S.G. Long; ; C. Lu

Book ID: 119374158
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 690 KB
Volume: 207
Category: Article
ISSN: 0257-8972
DOI: 10.1016/j.surfcoat.2012.07.002

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