Effects of deposition parameters on residual stresses, hardness and electrical resistivity of nanoscale twinned 330 stainless steel thin films

✍ Scribed by Zhang, X.; Misra, A.; Wang, H.; Lima, A. L.; Hundley, M. F.; Hoagland, R. G.

• Book ID: 121304331
• Publisher: American Institute of Physics
• Year: 2005
• Tongue: English
• Weight: 755 KB
• Volume: 97
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1883724