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Residual stress and Curie temperature of Fe–N thin films prepared by dc magnetron sputtering at elevated temperature

✍ Scribed by W.L. Li; Y. Sun; W.D. Fei

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 288 KB
Volume: 252
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2005.07.012

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