A correlation between the film properties of nitrides, oxides etc., and their structure, is of fundamental importance β not only for thin solid films physics but also for practical applications. The structure of the films depends on deposition methods and their parameters. The relationship between p
β¦ LIBER β¦
Effect of deposition condition on residual stress of iron nitride thin films prepared by magnetron sputtering and ion implantation
β Scribed by W.L. Li; W.D. Fei; T. Hanabusa
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 370 KB
- Volume
- 252
- Category
- Article
- ISSN
- 0169-4332
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