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Reliable synthesis of logic circuits

โœ Scribed by V. V. Tarasov

Publisher
Springer US
Year
1992
Tongue
English
Weight
265 KB
Volume
28
Category
Article
ISSN
1573-8337

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As integrated circuits scale down into nanometer dimensions, a great reduction on the reliability of combinational blocks is expected. This way, the susceptibility of circuits to intermittent and transient faults is becoming a key parameter in the evaluation of logic circuits, and fast and accurate