On the Design of Reliable Boolean Circui
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Dan Kleitman; Tom Leighton; Yuan Ma
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Article
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1997
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Elsevier Science
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English
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We investigate a model of gate failure for Boolean circuits in which a faulty gate is restricted to output one of its input values. For some types of gates, the model, which we call the short-circuit model of gate failure, is weaker than the traditional von Neumann model in which faulty gates always