Signal probability for reliability evalu
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Franco, Denis Teixeira; Vasconcelos, Maรยญ Correia; Naviner, Lirida; Naviner, Jea
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Article
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2008
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Elsevier Science
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English
โ 278 KB
As integrated circuits scale down into nanometer dimensions, a great reduction on the reliability of combinational blocks is expected. This way, the susceptibility of circuits to intermittent and transient faults is becoming a key parameter in the evaluation of logic circuits, and fast and accurate