Evaluating the signal-reliability of logic circuits : Kyung-Shik Koh. IEEE Trans. Reliab.R-34(3), 323 (1985)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 130 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90836-x