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Reliability study of AlGaN/GaN HEMT under electromagnetic, RF and DC stress

✍ Scribed by S. Khemiri; M. Kadi; A. Louis

Book ID: 113800581
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 899 KB
Volume: 51
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.07.074

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