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[IEEE 2011 International Conference on Electric Information and Control Engineering (ICEICE) - Wuhan, China (2011.04.15-2011.04.17)] 2011 International Conference on Electric Information and Control Engineering - Study on the reliability of AlGaN/GaN HEMTs at high temperature

โœ Scribed by Yang Juan, ; Zhang Xiaoling, ; Lv Changzhi,


Book ID
118183946
Publisher
IEEE
Year
2011
Weight
490 KB
Volume
0
Category
Article
ISBN
1424480361

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