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Reliability of ultra-thin titanium dioxide (TiO2) films on strained-Si

✍ Scribed by M.K. Bera; C. Mahata; C.K. Maiti

Book ID
108290161
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
420 KB
Volume
517
Category
Article
ISSN
0040-6090

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