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HRBS/channeling studies of ultra-thin ITO films on Si

โœ Scribed by P. Malar; T.K. Chan; C.S. Ho; T. Osipowicz


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
153 KB
Volume
266
Category
Article
ISSN
0168-583X

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๐Ÿ“œ SIMILAR VOLUMES


Fractal analyses of ITO thin films: A st
โœ Davood Raoufi ๐Ÿ“‚ Article ๐Ÿ“… 2010 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 326 KB

In this work it has been noticed that the topography of the annealed ITO thin film has very definite, dominant and predictable roles in the evolution of fractal and superstructures in ITO thin film topographies acquired by atomic force microscopy (AFM). It is found that, the spectral roughness of th