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A photoemission study of erbium silicide ultra-thin films epitaxially grown on Si(111)

✍ Scribed by J.-Y. Veuillen; D.B.B. Lollman; T.A. Nguyen Tan; L. Magaud


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
501 KB
Volume
65-66
Category
Article
ISSN
0169-4332

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