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Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium

✍ Scribed by M. Kozlowski; W.H. Smyrl; Lj. Atanasoska; R. Atanasoski

Publisher
Elsevier Science
Year
1989
Tongue
English
Weight
1009 KB
Volume
34
Category
Article
ISSN
0013-4686

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✦ Synopsis

Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the nonuniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide.

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